Reciprocity relations in transmission electron microscopy: A rigorous derivation

•Concise proof of principle of reciprocity in TEM is presented in multislice formalism.•Conditions for equivalence of STEM and CTEM images discussed.•Different normalisations addressed for absolute intensity comparisons.•Positions of apertures in relation to lenses considered. A concise derivation o...

Full description

Saved in:
Bibliographic Details
Published inMicron (Oxford, England : 1993) Vol. 92; pp. 1 - 5
Main Authors Krause, Florian F., Rosenauer, Andreas
Format Journal Article
LanguageEnglish
Published England Elsevier Ltd 01.01.2017
Subjects
chemical derivatives
CTEM
image analysis
Multislice
Principle of reciprocity
STEM
TEM
transmission electron microscopy
Principle of reciprocity
Multislice
TEM
CTEM
STEM
Online AccessGet full text

Cover

More Information
Summary:•Concise proof of principle of reciprocity in TEM is presented in multislice formalism.•Conditions for equivalence of STEM and CTEM images discussed.•Different normalisations addressed for absolute intensity comparisons.•Positions of apertures in relation to lenses considered. A concise derivation of the principle of reciprocity applied to realistic transmission electron microscopy setups is presented making use of the multislice formalism. The equivalence of images acquired in conventional and scanning mode is thereby rigorously shown. The conditions for the applicability of the found reciprocity relations is discussed. Furthermore the positions of apertures in relation to the corresponding lenses are considered, a subject which scarcely has been addressed in previous publications.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:0968-4328
1878-4291
1878-4291
DOI:10.1016/j.micron.2016.09.007