Dielectric response measurements utilizing semi-square voltage waveforms

• Published in: IEEE transactions on dielectrics and electrical insulation Vol. 15; no. 4; pp. 920 - 926
• Main Authors: Sonerud, B., Bengtsson, T., Blennow, J., Gubanski, S.M.
• Format: Journal Article
• Language: English
• Published: New York IEEE 01.08.2008; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: aging; Calibration; Circuits; Current measurement; dielectric materials; Dielectric measurements; Dielectrics; Dielectrics and electrical insulation; discrete Fourier transforms; Electric potential; Electrical insulation; Electrochemical impedance spectroscopy; High voltages; Impedance measurement; insulation testing; Monitoring; Performance evaluation; Voltage; Voltage measurement; Waveforms
• ISSN: 1070-9878; 1558-4135; 1558-4135
• DOI: 10.1109/TDEI.2008.4591211

Dielectric response measurements belong to the group of diagnostic tools used for quality evaluation of high voltage insulation systems. A measurement system called arbitrary waveform impedance spectroscopy (AWIS) is presented here which is capable of utilizing the harmonic content of repetitive voltages with a semi-square waveform and the corresponding current response to perform dielectric response measurements. Extensive circuit modeling and calibrations are required in order to perform accurate measurements. AWIS could offer new possibilities, especially for continuous monitoring of the dielectric properties of high voltage components and systems. The accuracy of the technique in both low and high voltage applications is verified by comparison with results obtained by means of the frequency domain spectroscopy (FDS) technique.