The suite of small‐angle neutron scattering instruments at Oak Ridge National Laboratory

Oak Ridge National Laboratory is home to the High Flux Isotope Reactor (HFIR), a high‐flux research reactor, and the Spallation Neutron Source (SNS), the world's most intense source of pulsed neutron beams. The unique co‐localization of these two sources provided an opportunity to develop a sui...

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Bibliographic Details
Published inJournal of applied crystallography Vol. 51; no. 2; pp. 242 - 248
Main Authors Heller, William T., Cuneo, Matthew, Debeer-Schmitt, Lisa, Do, Changwoo, He, Lilin, Heroux, Luke, Littrell, Kenneth, Pingali, Sai Venkatesh, Qian, Shuo, Stanley, Christopher, Urban, Volker S., Wu, Bin, Bras, Wim
Format Journal Article
LanguageEnglish
Published 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.04.2018
Blackwell Publishing Ltd
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Summary:Oak Ridge National Laboratory is home to the High Flux Isotope Reactor (HFIR), a high‐flux research reactor, and the Spallation Neutron Source (SNS), the world's most intense source of pulsed neutron beams. The unique co‐localization of these two sources provided an opportunity to develop a suite of complementary small‐angle neutron scattering instruments for studies of large‐scale structures: the GP‐SANS and Bio‐SANS instruments at the HFIR and the EQ‐SANS and TOF‐USANS instruments at the SNS. This article provides an overview of the capabilities of the suite of instruments, with specific emphasis on how they complement each other. A description of the plans for future developments including greater integration of the suite into a single point of entry for neutron scattering studies of large‐scale structures is also provided. The suite of small‐angle neutron scattering instrumentation available at the High Flux Isotope Reactor and Spallation Neutron Source of Oak Ridge National Laboratory is presented.
Bibliography:USDOE Office of Science (SC), Biological and Environmental Research (BER)
AC05-00OR22725
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S1600576718001231