Artificial neural networks applied to the analysis of synchrotron nuclear resonant scattering data

• Published in: Journal of synchrotron radiation Vol. 17; no. 1; pp. 86 - 92
• Main Authors: Planckaert, N., Demeulemeester, J., Laenens, B., Smeets, D., Meersschaut, J., L'abbé, C., Temst, K., Vantomme, A.
• Format: Journal Article
• Language: English
• Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.01.2010
• Subjects: Algorithms; artificial neural networks; Chromium - chemistry; data analysis; Iron - chemistry; Materials Testing - methods; Neural Networks (Computer); nuclear resonant scattering; Pattern Recognition, Automated - methods; Scattering, Radiation; Synchrotrons; X-Ray Diffraction - methods; X-Rays
• ISSN: 1600-5775; 0909-0495; 1600-5775
• DOI: 10.1107/S0909049509042824

The capabilities of artificial neural networks (ANNs) have been investigated for the analysis of nuclear resonant scattering (NRS) data obtained at a synchrotron source. The major advantage of ANNs over conventional analysis methods is that, after an initial training phase, the analysis is fully automatic and practically instantaneous, which allows for a direct intervention of the experimentalist on‐site. This is particularly interesting for NRS experiments, where large amounts of data are obtained in very short time intervals and where the conventional analysis method may become quite time‐consuming and complicated. To test the capability of ANNs for the automation of the NRS data analysis, a neural network was trained and applied to the specific case of an Fe/Cr multilayer. It was shown how the hyperfine field parameters of the system could be extracted from the experimental NRS spectra. The reliability and accuracy of the ANN was verified by comparing the output of the network with the results obtained by conventional data analysis.