Microtexture of chloride treated CdTe thin films deposited by CSS technique

• Published in: Journal of materials science Vol. 43; no. 2; pp. 573 - 579
• Main Authors: Quadros, João, Pinto, André L, Moutinho, Hélio R, Dhere, Ramesh G, Cruz, Leila R
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Boston Springer US 01.01.2008; Springer; Springer Nature B.V
• Subjects: Boundaries; Boundary maps; Cadmium chloride; Cadmium tellurides; CdTe; Characterization and Evaluation of Materials; Chemistry and Materials Science; Classical Mechanics; Condensed matter: structure, mechanical and thermal properties; Crystallography and Scattering Methods; Deposition; Diffraction patterns; Electron microscopes; Exact sciences and technology; Grain boundaries; grain boundary structure; Grain orientation; Grain size; Grains; Heat treatment; MATERIALS SCIENCE; Microtexture; Misalignment; Physics; Polymer Sciences; Recrystallization; scanning electron microscopes; Scanning electron microscopy; SOLAR ENERGY; Solid Mechanics; Spatial distribution; Structure and morphology; thickness; Sublimation; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); temperature; Texture; Thin film structure and morphology; Thin films; Texture Component; Boundary Structure; Pole Figure; Grain Boundary; Coincident Site Lattice; Cadmium Tellurides; Tellurides; Atomic force microscopy; Scanning electron microscopy; Inorganic compounds; Sublimation; Controlled atmospheres; Crystal growth from vapors; Grain orientation; Experimental study; Cadmium Chlorides; Texture; Heat treatments; Thin films; Closed systems; II-VI semiconductors; Pole figures
• ISSN: 0022-2461; 1573-4803
• DOI: 10.1007/s10853-007-1708-5

This work investigates the microstructural changes—especially in grain boundary structure and grain orientation distribution—in CdTe thin films deposited by close spaced sublimation at low (LT) and high temperatures (HT) and submitted to a CdCl₂ heat treatment. These changes are quantitatively described by microtexture analysis, a spatial distribution of the orientation of the grains. The analysis is performed in a scanning electron microscope by means of identification of the electron back-scattered diffraction patterns from individual grains. The texture of each grain, the misorientation between grains, and coincident site lattice boundary maps are obtained. The results show that the CdCl₂ treatment did not promote significant microstructural changes in HT-CdTe films, which grow with large and randomly oriented grains, and with a predominance of high-angle boundaries. On the other hand, for LT-CdTe films, this treatment promotes a substantial increase in grain size, a decreasing of preferential orientation, and an increase in the number of CSL and high-angle boundaries. These changes are considered to be a strong evidence for recrystallization.