Searching events in AFM force‐extension curves: A wavelet approach

An algorithm, based on the wavelet scalogram energy, for automatically detecting events in force‐extension AFM force spectroscopy experiments is introduced. The events to be detected are characterized by a discontinuity in the signal. It is shown how the wavelet scalogram energy has different decay...

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Bibliographic Details
Published inMicroscopy research and technique Vol. 80; no. 1; pp. 153 - 159
Main Authors Benitez, R, Bolos, V J
Format Journal Article
LanguageEnglish
Published United States Wiley Subscription Services, Inc 01.01.2017
Subjects
Algorithms
Atomic force microscopy
automatic event detection
batch processing
Decay rate
Discontinuity
Microscopy
Regularity
tether detection
Tethers
Wavelet
wavelet analysis
tether detection
automatic event detection
batch processing
atomic force microscopy
wavelet analysis
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Summary:An algorithm, based on the wavelet scalogram energy, for automatically detecting events in force‐extension AFM force spectroscopy experiments is introduced. The events to be detected are characterized by a discontinuity in the signal. It is shown how the wavelet scalogram energy has different decay rates at different points depending on the degree of regularity of the signal, showing faster decay rates at regular points and slower rates at singular points (jumps). It is shown that these differences produce peaks in the scalogram energy plot at the event points. Finally, the algorithm is illustrated in a tether analysis experiment by using it for the detection of events in the AFM force‐extension curves susceptible to being considered tethers. Microsc. Res. Tech. 80:153–159, 2017. © 2016 Wiley Periodicals, Inc.
Bibliography:Review Editor: Prof. Jose Luis Toca‐Herrera
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1059-910X
1097-0029
DOI:10.1002/jemt.22720