Optimized preparation of cross-sectional TEM specimens of organic thin films

• Published in: Ultramicroscopy Vol. 98; no. 1; pp. 51 - 55
• Main Authors: Dürr, A.C., Schreiber, F., Kelsch, M., Dosch, H.
• Format: Journal Article
• Language: English
• Published: Amsterdam Elsevier B.V 01.12.2003; Elsevier Science
• Subjects: Condensed matter: structure, mechanical and thermal properties; Cross-sectional transmission electron microscopy; Diindenoperylene; Electron, ion, and scanning probe microscopy; Exact sciences and technology; Laboratory procedures; Metal–organic interfaces; Metrology, measurements and laboratory procedures; Organic thin films; Physics; Sample preparation; Sample preparation (including design of sample holders); Structure of solids and liquids; crystallography; Transmission, reflection and scanning electron microscopy(including ebic); Diindenoperylene; 68.37; Sample preparation; 06.60.c; 81.07.b; Organic thin films; Cross-sectional transmission electron microscopy; Metal–organic interfaces; 81.65.Ps; Thin films; Interfaces; Transmission electron microscopy; Cross sectional study; X-ray spectroscopy; Experimental study; Spatial resolution; Organic compounds
• ISSN: 0304-3991; 1879-2723
• DOI: 10.1016/S0304-3991(03)00087-1

We present a route for the preparation of cross-sectional TEM specimens of crystalline organic thin films which minimizes the mechanical, chemical and thermal load of the organic film during preparation and allows to take TEM images with molecular resolution. A typical example of a thin film of diindenoperylene capped with a thin layer of gold is shown to demonstrate the application of the technique for the investigation of metal–organic interfaces.