New attempt to combine scanning electron microscopy and small‐angle scattering in reciprocal space
An attempt has been made to combine small‐angle scattering of X‐rays or neutrons with scanning electron microscopy in reciprocal space, in order to establish a structural analysis method covering a wide range of sizes from micro‐ to macro‐scales. A system with a binary contrast, in which scattering...
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Published in | Journal of applied crystallography Vol. 52; no. 4; pp. 783 - 790 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
5 Abbey Square, Chester, Cheshire CH1 2HU, England
International Union of Crystallography
01.08.2019
Blackwell Publishing Ltd |
Subjects | |
Online Access | Get full text |
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Summary: | An attempt has been made to combine small‐angle scattering of X‐rays or neutrons with scanning electron microscopy in reciprocal space, in order to establish a structural analysis method covering a wide range of sizes from micro‐ to macro‐scales. A system with a binary contrast, in which scattering objects with a homogeneous density are dispersed in vacuum (or air), is considered. A topological surface image, detected by secondary electron emission, is converted by means of a Fourier transform into a two‐dimensional scattering amplitude in reciprocal space. The method was first tested by studying a dilute system of monodisperse SiO2 particles, with respect to calibrations for brightness inversion, noise reduction and two‐dimensional Fourier transform, to obtain a scattering amplitude that agrees well with the analytical amplitude for a spherical particle. Secondly, the microstructure of a carbon‐supported Pt catalyst for polymer electrolyte fuel cell applications was examined with the combined method, covering length scales from 10 µm down to nanometres. After two‐dimensional Fourier transformation, the secondary electron emission images with low magnification are able to overcome the limitation of the minimum wavenumber (qmin) detectable by ultra‐small‐angle scattering.
An attempt has been made to combine small‐angle scattering of X‐rays or neutrons with scanning electron microscopy in reciprocal space, in order to establish a structural analysis method covering a wide range of sizes from micro‐ to macro‐scales. |
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ISSN: | 1600-5767 0021-8898 1600-5767 |
DOI: | 10.1107/S1600576719009208 |