Sputter deposition and analysis of thin film Nitinol/Terfenol-D multilaminate for vibration damping

• Published in: Smart materials and structures Vol. 18; no. 1; pp. 015007 - 015007 (7)
• Main Authors: Kerrigan, C A, Ho, K K, Mohanchandra, K P, Carman, G P
• Format: Journal Article
• Language: English
• Published: Bristol IOP Publishing 01.01.2009; Institute of Physics
• Subjects: Exact sciences and technology; Fundamental areas of phenomenology (including applications); Physics; Solid mechanics; Structural and continuum mechanics; Vibration, mechanical wave, dynamic stability (aeroelasticity, vibration control...); Viscoelasticity; Internal friction; Stratified material; Multilayer coating; X ray radiography; Superconductor device; Dispersive spectrometry; X ray diffraction; Modeling; Wavelength; Sputter coating; Thin film; Dynamic test; Vibration damping; SQUID devices; Wide band; Silicon; Nitinol
• ISSN: 0964-1726; 1361-665X
• DOI: 10.1088/0964-1726/18/1/015007

Nitinol/silicon laminates and Nitinol/Terfenol-D/nickel laminates were sputter deposited and characterized using x-ray diffraction (XRD), wavelength dispersive spectrometry (WDS), and a SQUID (superconducting quantum interference device). Dynamic testing showed substantial damping (tandelta) measurable in each laminate. An analytical model of a heterogeneous layered thin film damping material was also developed. Parametric studies with the analytical model illustrate the effect of combining Terfenol-D and Nitinol to create a broadband damping laminate with relatively constant tandelta for strain values between 0.05% and 1%. The model also illustrates the importance of relative stiffness on the damping of multilayer laminates, i.e. relatively high stiffness damping materials such as Terfenol-D and Nitinol may be superior to lower stiffness visco-elastics.