Investigation of Tibetian Plateau varnish: new findings at the nanoscale using focused ion beam and transmission electron microscopy techniques

Dual‐beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high‐resolution transmission electron microscopy (HR‐TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techni...

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Bibliographic Details
Published inScanning Vol. 33; no. 2; pp. 78 - 81
Main Authors Langworthy, Kurt A., Krinsley, David H., Dorn, Ronald I.
Format Journal Article
LanguageEnglish
Published San Francisco Wiley Subscription Services, Inc., A Wiley Company 01.03.2011
Hindawi Limited
Subjects
EDS
FIB
geology
Ion beams
Nanocomposites
Nanomaterials
nanoscale
Nanostructure
Scanning
STEM
Surface layer
Texture
Tibet
Varnishes
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Summary:Dual‐beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high‐resolution transmission electron microscopy (HR‐TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techniques could provide a method for studying ancient terrestrial and extra‐terrestrial environments to better understand geological processes at the nanoscale. SCANNING 33: 78–81, 2011. © 2011 Wiley Periodicals, Inc.
Bibliography:istex:F1724D6FF0A973E81B7AAA1F32A772F6EAC1812F
ark:/67375/WNG-TRQMDBDB-K
ArticleID:SCA20226
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:0161-0457
1932-8745
1932-8745
DOI:10.1002/sca.20226