A review of reliability prediction methods for electronic devices

A wide range of reliability prediction methods is available today for electronic systems. This article classifies the commonly used and referred to reliability prediction methodologies into some categories easy to understand. A set of selected methods, which are of relevance to many industries, the...

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Bibliographic Details
Published inMicroelectronics and reliability Vol. 42; no. 8; pp. 1155 - 1162
Main Authors Foucher, B, Boullié, J, Meslet, B, Das, D
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.08.2002
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Summary:A wide range of reliability prediction methods is available today for electronic systems. This article classifies the commonly used and referred to reliability prediction methodologies into some categories easy to understand. A set of selected methods, which are of relevance to many industries, the aerospace industry among others, are reviewed and the possibility they offer to address the stated objectives is assessed. Their respective advantages and shortcomings are the basis for the recommendation we make to use the methods in a combined fashion (simultaneously or successively) along the product development process.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0026-2714
1872-941X
DOI:10.1016/S0026-2714(02)00087-2