Penalized partially linear models using sparse representations with an application to fMRI time series

In this paper, we consider modeling the nonparametric component in partially linear models (PLMs) using linear sparse representations, e.g., wavelet expansions. Two types of representations are investigated, namely, orthogonal bases (complete) and redundant overcomplete expansions. For bases, we int...

Full description

Saved in:
Bibliographic Details
Published inIEEE transactions on signal processing Vol. 53; no. 9; pp. 3436 - 3448
Main Authors Fadili, J.M., Bullmore, E.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.09.2005
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Online AccessGet full text

Cover

Loading…
Abstract In this paper, we consider modeling the nonparametric component in partially linear models (PLMs) using linear sparse representations, e.g., wavelet expansions. Two types of representations are investigated, namely, orthogonal bases (complete) and redundant overcomplete expansions. For bases, we introduce a regularized estimator of the nonparametric part. The important contribution here is that the nonparametric part can be parsimoniously estimated by choosing an appropriate penalty function for which the hard and soft thresholding estimators are special cases. This allows us to represent in an effective manner a broad class of signals, including stationary and/or nonstationary signals and avoids excessive bias in estimating the parametric component. We also give a fast estimation algorithm. The method is then generalized to handle the case of overcomplete representations. A large-scale simulation study is conducted to illustrate the finite sample properties of the estimator. The estimator is finally applied to real neurophysiological functional magnetic resonance imaging (MRI) data sets that are suspected to contain both smooth and transient drift features.
AbstractList In this paper, we consider modeling the nonparametric component in partially linear models (PLMs) using linear sparse representations, e.g., wavelet expansions. Two types of representations are investigated, namely, orthogonal bases (complete) and redundant overcomplete expansions. For bases, we introduce a regularized estimator of the nonparametric part. The important contribution here is that the nonparametric part can be parsimoniously estimated by choosing an appropriate penalty function for which the hard and soft thresholding estimators are special cases. This allows us to represent in an effective manner a broad class of signals, including stationary and/or nonstationary signals and avoids excessive bias in estimating the parametric component. We also give a fast estimation algorithm. The method is then generalized to handle the case of overcomplete representations. A large-scale simulation study is conducted to illustrate the finite sample properties of the estimator. The estimator is finally applied to real neurophysiological functional magnetic resonance imaging (MRI) data sets that are suspected to contain both smooth and transient drift features.
The estimator is finally applied to real neurophysiological functional magnetic resonance imaging (MRI) data sets that are suspected to contain both smooth and transient drift features.
Author Bullmore, E.
Fadili, J.M.
Author_xml – sequence: 1
  givenname: J.M.
  surname: Fadili
  fullname: Fadili, J.M.
  organization: Image Process. Group, GREYC CNRS UMR, Caen, France
– sequence: 2
  givenname: E.
  surname: Bullmore
  fullname: Bullmore, E.
BackLink http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=17032718$$DView record in Pascal Francis
https://hal.science/hal-00260246$$DView record in HAL
BookMark eNp9kc9rFTEQxxepYFs9e_ASBBUP-5rfmxxLUVt4YtEK3kI2O7Epedltsk-pf71Zt1jw4GmGmc98mZnvUXOQxgRN85zgDSFYn1x9udxQjMVGCUZx96g5JJqTFvNOHtQcC9YK1X170hyVcoMx4VzLw8ZfQrIx_IIBTTbPwcZ4h2JIYDPajQPEgvYlpO-o1HYBlGHKUCDNdg5jKuhnmK-RTchOUwzuTxHNI_IfP1-gOewAFcgBytPmsbexwLP7eNx8ff_u6uy83X76cHF2um0dF3JuVT9457ToMO27ZWXPcYeF6pW0ovd4YAMXlGrAwkk6KK96L0F77h1lTCh23Lxdda9tNFMOO5vvzGiDOT_dmqWGMZWYcvmDVPbNyk55vN1Dmc0uFAcx2gTjvhilJem4lLqSr_9LUoWlYIxX8OU_4M24z_XBVU1qwiiRskInK-TyWEoG_3dRgs1ipalWmsVKs1pZJ17dy9ribPTZJhfKw1iHGe3Icv2LlQsA8NDmWihF2G-sPqg5
CODEN ITPRED
CitedBy_id crossref_primary_10_1016_j_dsp_2017_04_006
crossref_primary_10_1016_j_jss_2014_09_025
crossref_primary_10_1177_1471082X1001100502
crossref_primary_10_1016_j_sigpro_2011_03_008
crossref_primary_10_1016_j_jneumeth_2008_03_017
crossref_primary_10_1117_1_3127204
crossref_primary_10_3390_en6052583
crossref_primary_10_1007_s11222_007_9019_x
crossref_primary_10_1214_07_SS014
crossref_primary_10_1007_s11749_012_0310_6
crossref_primary_10_1007_s10260_020_00511_z
crossref_primary_10_1109_TSP_2019_2899289
crossref_primary_10_1155_2018_1730149
crossref_primary_10_3390_math11173706
crossref_primary_10_1002_hbm_21116
crossref_primary_10_1109_TSP_2008_928160
crossref_primary_10_1016_j_media_2012_05_006
crossref_primary_10_1080_03610918_2018_1494279
Cites_doi 10.1017/S026646660420202X
10.1214/aos/1176347115
10.2307/1390659
10.1016/0167-7152(86)90067-2
10.1016/j.csda.2003.10.018
10.1109/42.759109
10.1214/aos/1176350695
10.1109/TMI.2003.809587
10.1214/aos/1034276628
10.1111/j.0006-341X.1999.00699.x
10.1137/S1064827596304010
10.1198/1061860032076
10.1109/TIP.2005.852206
10.1080/01621459.1994.10476774
10.1080/01621459.1997.10474001
10.1109/78.277854
10.1007/978-3-642-57700-0
10.1016/0378-3758(89)90037-2
10.2307/2337118
10.1198/016214501753208942
10.1111/j.1467-9892.1992.tb00103.x
10.1006/nimg.2001.0955
10.1198/1061860043434
10.1137/S0036139997327794
10.1137/1.9781611971309
10.1007/BF01404567
10.1016/S0167-9473(98)00054-1
10.1016/S0165-1684(97)83621-3
10.1093/biomet/77.1.1
10.1080/01621459.1990.10476211
10.1007/978-1-4899-4541-9
ContentType Journal Article
Copyright 2005 INIST-CNRS
Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005
Distributed under a Creative Commons Attribution 4.0 International License
Copyright_xml – notice: 2005 INIST-CNRS
– notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2005
– notice: Distributed under a Creative Commons Attribution 4.0 International License
DBID 97E
RIA
RIE
IQODW
AAYXX
CITATION
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
F28
FR3
1XC
DOI 10.1109/TSP.2005.853207
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005-present
IEEE All-Society Periodicals Package (ASPP) 1998-Present
IEEE Xplore
Pascal-Francis
CrossRef
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Technology Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
Hyper Article en Ligne (HAL)
DatabaseTitle CrossRef
Technology Research Database
Computer and Information Systems Abstracts – Academic
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts Professional
Engineering Research Database
ANTE: Abstracts in New Technology & Engineering
DatabaseTitleList Technology Research Database

Technology Research Database

Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore
  url: https://proxy.k.utb.cz/login?url=https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Computer Science
EISSN 1941-0476
EndPage 3448
ExternalDocumentID oai_HAL_hal_00260246v1
2361896961
10_1109_TSP_2005_853207
17032718
1495881
Genre orig-research
GroupedDBID -~X
.DC
0R~
29I
3EH
4.4
53G
5GY
5VS
6IK
85S
97E
AAJGR
AASAJ
AAYOK
ABFSI
ABQJQ
ABVLG
ACGFO
ACIWK
ACKIV
ACNCT
AENEX
AETIX
AI.
AIBXA
AJQPL
AKJIK
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
E.L
EBS
EJD
F5P
HZ~
H~9
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
MS~
O9-
OCL
P2P
RIA
RIE
RIG
RNS
TAE
TN5
VH1
XFK
ABPTK
IQODW
AAYXX
CITATION
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
F28
FR3
1XC
ID FETCH-LOGICAL-c456t-8bdfcc95702b71053f407058b86a5bf0d3d45229e05c62d8f8bf6e9f4fc233583
IEDL.DBID RIE
ISSN 1053-587X
IngestDate Fri Sep 06 12:40:10 EDT 2024
Sat Aug 17 00:52:24 EDT 2024
Sat Aug 17 04:27:06 EDT 2024
Fri Sep 13 06:05:40 EDT 2024
Fri Aug 23 02:05:27 EDT 2024
Sun Oct 22 16:06:21 EDT 2023
Wed Jun 26 19:20:39 EDT 2024
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Issue 9
Keywords penalized estimation
Threshold detection
sparse representations
Time series
Non parametric estimation
Functional analysis
Nuclear magnetic resonance imaging
Modeling
Linear model
neuroimaging
Penalty function
fMRI
Simulation
partially linear models
wavelets
Medical imagery
Sparse representation
Stationary signal
Fast algorithm
Functional imaging
Language English
License CC BY 4.0
Distributed under a Creative Commons Attribution 4.0 International License: http://creativecommons.org/licenses/by/4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c456t-8bdfcc95702b71053f407058b86a5bf0d3d45229e05c62d8f8bf6e9f4fc233583
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
OpenAccessLink http://www.stat.purdue.edu/~tlzhang/mathstat/fadili2005.pdf
PQID 869132166
PQPubID 23500
PageCount 13
ParticipantIDs proquest_miscellaneous_28065334
proquest_miscellaneous_896174669
proquest_journals_869132166
crossref_primary_10_1109_TSP_2005_853207
hal_primary_oai_HAL_hal_00260246v1
ieee_primary_1495881
pascalfrancis_primary_17032718
PublicationCentury 2000
PublicationDate 2005-09-01
PublicationDateYYYYMMDD 2005-09-01
PublicationDate_xml – month: 09
  year: 2005
  text: 2005-09-01
  day: 01
PublicationDecade 2000
PublicationPlace New York, NY
PublicationPlace_xml – name: New York, NY
– name: New York
PublicationTitle IEEE transactions on signal processing
PublicationTitleAbbrev TSP
PublicationYear 2005
Publisher IEEE
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: Institute of Electrical and Electronics Engineers
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref35
ref13
ref34
ref12
ref37
ref15
ref36
ref14
ref31
ref30
heckman (ref3) 1986; 48
gao (ref10) 1992
ref11
ref39
ref17
ref38
ref16
ref19
ref18
meyer (ref28) 1992
horn (ref41) 1997
anderson (ref33) 1984
ref23
ref26
ref25
ref20
ref22
speckman (ref9) 1988; 50
amato (ref27) 1997; 42
ref29
ref8
ref7
hastie (ref2) 1990
ref4
gribonval (ref24) 2004
jansen (ref32) 1997; 56
fadili (ref21) 2001
ref6
ref5
ref40
härdle (ref1) 2000
References_xml – ident: ref36
  doi: 10.1017/S026646660420202X
– ident: ref35
  doi: 10.1214/aos/1176347115
– year: 2001
  ident: ref21
  publication-title: Semiparametric time series regression using library of orthonormal waveform bases and the MDL principle
  contributor:
    fullname: fadili
– year: 1984
  ident: ref33
  publication-title: An Introduction to Multivariate Statistical Analysis
  contributor:
    fullname: anderson
– ident: ref19
  doi: 10.2307/1390659
– ident: ref13
  doi: 10.1016/0167-7152(86)90067-2
– year: 1997
  ident: ref41
  publication-title: Matrix Analysis
  contributor:
    fullname: horn
– ident: ref16
  doi: 10.1016/j.csda.2003.10.018
– ident: ref18
  doi: 10.1109/42.759109
– ident: ref8
  doi: 10.1214/aos/1176350695
– ident: ref17
  doi: 10.1109/TMI.2003.809587
– year: 2004
  ident: ref24
  publication-title: A simple test to check the optimality of a sparse signal approximation
  contributor:
    fullname: gribonval
– year: 1992
  ident: ref28
  publication-title: Ondelettes et op&#x00E9 rateurs
  contributor:
    fullname: meyer
– year: 1990
  ident: ref2
  publication-title: Generalized Additive Models
  contributor:
    fullname: hastie
– ident: ref15
  doi: 10.1214/aos/1034276628
– ident: ref34
  doi: 10.1111/j.0006-341X.1999.00699.x
– ident: ref38
  doi: 10.1137/S1064827596304010
– ident: ref40
  doi: 10.1198/1061860032076
– ident: ref39
  doi: 10.1109/TIP.2005.852206
– volume: 42
  start-page: 481
  year: 1997
  ident: ref27
  article-title: wavelet approximation of a function from samples affected by noise
  publication-title: Rev Roumaine Math Pures Appl
  contributor:
    fullname: amato
– ident: ref11
  doi: 10.1080/01621459.1994.10476774
– year: 1992
  ident: ref10
  publication-title: Large Sample Theory in Semiparametric Regression Models
  contributor:
    fullname: gao
– ident: ref12
  doi: 10.1080/01621459.1997.10474001
– volume: 48
  start-page: 244
  year: 1986
  ident: ref3
  article-title: spline smoothing in partly linear models
  publication-title: J R Statist Soc B
  contributor:
    fullname: heckman
– ident: ref29
  doi: 10.1109/78.277854
– year: 2000
  ident: ref1
  publication-title: Partially Linear Models
  doi: 10.1007/978-3-642-57700-0
  contributor:
    fullname: härdle
– ident: ref4
  doi: 10.1016/0378-3758(89)90037-2
– volume: 50
  start-page: 413
  year: 1988
  ident: ref9
  article-title: kernel smoothing in partial linear models
  publication-title: J R Statist Soc B
  contributor:
    fullname: speckman
– ident: ref30
  doi: 10.2307/2337118
– ident: ref25
  doi: 10.1198/016214501753208942
– ident: ref14
  doi: 10.1111/j.1467-9892.1992.tb00103.x
– ident: ref20
  doi: 10.1006/nimg.2001.0955
– ident: ref22
  doi: 10.1198/1061860043434
– ident: ref23
  doi: 10.1137/S0036139997327794
– ident: ref26
  doi: 10.1137/1.9781611971309
– ident: ref31
  doi: 10.1007/BF01404567
– ident: ref7
  doi: 10.1016/S0167-9473(98)00054-1
– volume: 56
  start-page: 33
  year: 1997
  ident: ref32
  article-title: generalized cross validation for wavelet thresholding
  publication-title: Signal Process
  doi: 10.1016/S0165-1684(97)83621-3
  contributor:
    fullname: jansen
– ident: ref5
  doi: 10.1093/biomet/77.1.1
– ident: ref6
  doi: 10.1080/01621459.1990.10476211
– ident: ref37
  doi: 10.1007/978-1-4899-4541-9
SSID ssj0014496
Score 1.9755201
Snippet In this paper, we consider modeling the nonparametric component in partially linear models (PLMs) using linear sparse representations, e.g., wavelet...
The estimator is finally applied to real neurophysiological functional magnetic resonance imaging (MRI) data sets that are suspected to contain both smooth and...
SourceID hal
proquest
crossref
pascalfrancis
ieee
SourceType Open Access Repository
Aggregation Database
Index Database
Publisher
StartPage 3436
SubjectTerms Algorithms
Biological and medical sciences
Biological system modeling
Biomedical engineering
Biomedical imaging
Computer Science
Computer simulation
Computerized, statistical medical data processing and models in biomedicine
Econometrics
Economic models
Engineering Sciences
Estimators
fMRI
Humans
Large-scale systems
Linear regression
Magnetic resonance imaging
Mathematical analysis
Medical management aid. Diagnosis aid
Medical sciences
Neuroimaging
partially linear models
penalized estimation
Polynomials
Redundant
Representations
Signal and Image processing
sparse representations
Studies
Time series
Vectors
wavelets
Title Penalized partially linear models using sparse representations with an application to fMRI time series
URI https://ieeexplore.ieee.org/document/1495881
https://www.proquest.com/docview/869132166/abstract/
https://search.proquest.com/docview/28065334
https://search.proquest.com/docview/896174669
https://hal.science/hal-00260246
Volume 53
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV1Lb9QwEB61PcGBV0GEQmshDhzINoljxz5WiGpBLKqglfYWOfa4lVplq022Uvvr8Ti72xaKxC1KLMuZ8WPGM_N9AB-cdgrRiFTywgUHxZtUUa4rN0j-NfKSU6Hw5Iccn5TfpmK6AZ_WtTCIGJPPcESPMZbvZnZBV2X7ZM0rqrPeVFkx1GqtIwZlGbm4grnAU6Gq6RLGJ8_0_vGvo-HyRBELQnXvBNo8o_zHSKxCaZGmC5LxA6XFX7tzPHIOn8JkNdgh0-R8tOibkb35A8fxf__mGTxZ2p7sYJgsz2ED2xfw-A4i4Tb4IyTL_AYdu6RJZS4urhlZombOImlOxyhT_pSFjWjeIYuYmKv6pbZjdK3LTMvuxMVZP2N-8vMrIxp7RjMeu5dwcvjl-PM4XVIxpDZYWH2qGuet1aLKiqYiGfvgCGZCNUoa0fjMcUfQ7BozYWXhlFeNl6h96W3BuVD8FWy1sxZfA7Pa2qpRma-ML0Pnhnubc9Hk6FBYLBL4uFJPfTkgbtTRU8l0HTRJvJmiHjSZwPugvnUrQsoeH3yv6V3ESitKeZUnsE2yv-1rEHsCu_e0ffs97IFFOLET2Fmpv16u665WUgf3PZcygb3117AgKcpiWpwtujqGqjkvE2D_aKF0MBtLKfWbh4e2A48iQGzMZHsLW_18ge-C6dM3u3HO_waSPgJJ
link.rule.ids 230,315,786,790,802,891,27957,27958,55109
linkProvider IEEE
linkToHtml http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwjV3db9MwED-N8QA88DUQYbBZiAceSJfGsWM_Toipg3aaoJP6Fjn2eUhM6dSkSOyvx-e03caHxFuUWJZzd_bd-e5-B_DWaacQjUglz11wULxJFeW6coPkXyMvOBUKT07k6Kz4NBOzLXi_qYVBxJh8hgN6jLF8N7dLuio7IGteUZ313aDnM91Xa21iBkURu3EFg4GnQpWzFZBPGHgw_XraX58o6oNQ3tJBd75RBmRsrUKJkaYNtPF9U4s_zueodI4ewWS93D7X5Ptg2dUDe_UbkuP__s9jeLiyPtlhLy5PYAubp_DgBibhDvhTJNv8Ch27JLEyFxc_GdmiZsFi25yWUa78OQtH0aJFFlEx1xVMTcvoYpeZht2IjLNuzvzkyzGjRvaMZB7bZ3B29HH6YZSumjGkNthYXapq563VoszyuiQa--AKZkLVShpR-8xxR-DsGjNhZe6UV7WXqH3hbc65UPw5bDfzBl8As9raslaZL40vwuSGezvkoh6iQ2ExT-Ddmj3VZY-5UUVfJdNV4CR1zhRVz8kE3gT2bUYRVvbocFzRu4iWlhfyxzCBHaL99Vw92RPYu8Xt6-_hFMyDzk5gd83-arWz20pJHRz4oZQJ7G--hi1JcRbT4HzZVjFYzXmRAPvHCKWD4VhIqV_-fWn7cG80nYyr8fHJ5124H-FiY17bK9juFkt8HQyhrt6L8v8LTvMFnw
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Penalized+Partially+Linear+Models+Using+Sparse+Representations+With+an+Application+to+fMRI+Time+Series&rft.jtitle=IEEE+transactions+on+signal+processing&rft.au=Fadili%2C+J+M&rft.au=Bullmore%2C+E&rft.date=2005-09-01&rft.issn=1053-587X&rft.volume=53&rft.issue=9&rft_id=info:doi/10.1109%2FTSP.2005.853207&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1053-587X&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1053-587X&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1053-587X&client=summon