Soft X-ray emission spectroscopy study of characteristic bonding states and its distribution of amorphous carbon-nitride (a-CNx) films

• Published in: Microscopy
• Main Authors: Ishii, Shingo, Terauchi, Masami, Sato, Yohei, Tamura, Naoyuki, Aono, Masami, Abe, Hiroshi
• Format: Journal Article
• Language: English
• Published: England 01.08.2018
• ISSN: 2050-5701
• DOI: 10.1093/jmicro/dfy024

Soft X-ray emission spectroscopy based on electron microscopy was applied to investigate bonding electron states of amorphous carbon nitride (a-CNx) films with different nitrogen contents of x. Carbon K-emission spectrum showed characteristic intensity distribution of not only sp2 bonding but also sp3 bonding. The a-CNx film with lager x, which has a larger macroscopic electric resistivity, shows a larger content of the carbon sp3: C-C bonding signal. Furthermore, the dependence of spectral intensity distribution on x suggests the presence of sp2: C-N and sp3: C-N bonding. Those results show that the relation between macroscopic electrical resistivity of a-CNx film and its nitrogen content is because of the decrease of sp2: C-C bonding and the formation of sp2: C-N and sp3: C-C and C-N bonding conformation induced by an introduction of nitrogen atoms. Spatial variation of a signal ratio of sp3/sp2 was visualized and was confirmed as a relation between sp3 boding amount and nitrogen content x.