Temperature analysis and characteristics of highly strained InGaAs-GaAsP-GaAs (/spl lambda/ > 1.17 /spl mu/m) quantum-well lasers

Characteristic temperature coefficients of the threshold current (T/sub 0/) and the external differential quantum efficiency (T/sub 1/) are studied as simple functions of the temperature dependence of the physical parameters of the semiconductor lasers. Simple expressions of characteristic temperatu...

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Bibliographic Details
Published inIEEE journal of quantum electronics Vol. 38; no. 6; pp. 640 - 651
Main Authors Tansu, N., Ying-Lan Chang, Takeuchi, T., Bour, D.P., Corzine, S.W., Tan, M.R.T., Mawst, L.J.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.06.2002
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:Characteristic temperature coefficients of the threshold current (T/sub 0/) and the external differential quantum efficiency (T/sub 1/) are studied as simple functions of the temperature dependence of the physical parameters of the semiconductor lasers. Simple expressions of characteristic temperature coefficients of the threshold current (T/sub 0/) and the external differential quantum efficiency (T/sub 1/) are expressed as functions as physical parameters and their temperature dependencies. The parameters studied here include the threshold (J/sub th/) and transparency (J/sub tr/) current density, the carrier injection efficiency (/spl eta//sub inj/) and external (/spl eta//sub d/) differential quantum efficiency, the internal loss (/spl alpha//sub i/), and the material gain parameter (g/sub o/). The temperature analysis is performed on low-threshold current density (/spl lambda/ = 1.17-1.19 /spl mu/m) InGaAs-GaAsP-GaAs quantum-well lasers, although it is applicable to lasers with other active-layer materials. Analytical expressions for T/sub 0/ and T/sub 1/ are shown to accurately predict the cavity length dependence of these parameters for the InGaAs active lasers.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:0018-9197
1558-1713
DOI:10.1109/JQE.2002.1005415