Temperature analysis and characteristics of highly strained InGaAs-GaAsP-GaAs (/spl lambda/ > 1.17 /spl mu/m) quantum-well lasers
Characteristic temperature coefficients of the threshold current (T/sub 0/) and the external differential quantum efficiency (T/sub 1/) are studied as simple functions of the temperature dependence of the physical parameters of the semiconductor lasers. Simple expressions of characteristic temperatu...
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Published in | IEEE journal of quantum electronics Vol. 38; no. 6; pp. 640 - 651 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
New York, NY
IEEE
01.06.2002
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | Characteristic temperature coefficients of the threshold current (T/sub 0/) and the external differential quantum efficiency (T/sub 1/) are studied as simple functions of the temperature dependence of the physical parameters of the semiconductor lasers. Simple expressions of characteristic temperature coefficients of the threshold current (T/sub 0/) and the external differential quantum efficiency (T/sub 1/) are expressed as functions as physical parameters and their temperature dependencies. The parameters studied here include the threshold (J/sub th/) and transparency (J/sub tr/) current density, the carrier injection efficiency (/spl eta//sub inj/) and external (/spl eta//sub d/) differential quantum efficiency, the internal loss (/spl alpha//sub i/), and the material gain parameter (g/sub o/). The temperature analysis is performed on low-threshold current density (/spl lambda/ = 1.17-1.19 /spl mu/m) InGaAs-GaAsP-GaAs quantum-well lasers, although it is applicable to lasers with other active-layer materials. Analytical expressions for T/sub 0/ and T/sub 1/ are shown to accurately predict the cavity length dependence of these parameters for the InGaAs active lasers. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 0018-9197 1558-1713 |
DOI: | 10.1109/JQE.2002.1005415 |