Dose and dose-rate dependence of mutation frequency under long-term exposure - a new look at DDREF from WAM model

• Published in: Journal of nuclear science and technology Vol. 53; no. 11; pp. 1824 - 1830
• Main Authors: Wada, Takahiro, Manabe, Yuichiro, Nakamura, Issei, Tsunoyama, Yuichi, Nakajima, Hiroo, Bando, Masako
• Format: Journal Article
• Language: English
• Published: Tokyo Taylor & Francis 01.11.2016; Taylor & Francis Ltd
• Subjects: DDREF; Dependence; Dose rate; Hypotheses; LNT hypothesis; long-term exposure; mathematical model; Mutation; radiation damage; radiation protection
• ISSN: 0022-3131; 1881-1248
• DOI: 10.1080/00223131.2016.1164635

We have investigated the dependence of the mutation frequency on the dose and dose rate of artificial radiation using the Whack-A-Mole (WAM) model that we recently proposed. In particular, we pay special attention to the case of long-term and low-dose-rate exposure. Our results indicate that the WAM model successfully describes the dose-rate dependence, and it can replace the so-called dose and dose-rate effectiveness factor (DDREF), which has been used for long, to account for the differences between high-dose-rate and low-dose-rate data. The basic properties of the WAM model are discussed with special emphasis on the dose-rate dependence in order to demonstrate how the dose-rate dependence, which is built into the model explicitly, plays a key role. Biological effects of long-term exposure to extremely low-dose-rate radiation are discussed in light of analysis of mega-mouse experiments using the WAM model. In the WAM model, the effects of long-term exposure show a saturation property, thus making it distinctly different from the 'linear no threshold (LNT)' hypothesis that predicts a linear increase of the effects with time.