Investigation on Relationship between Common Mode Noise and Distribution of Parasitic Capacitance

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Bibliographic Details
Published inIEEJ JOURNAL OF INDUSTRY APPLICATIONS Vol. 12; no. 3; pp. 484 - 492
Main Authors Sasaki, Mamoru, Imaoka, Jun, Yamamoto, Masayoshi
Format Journal Article
LanguageEnglish
Published 01.05.2023
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ISSN:2187-1094
2187-1108
DOI:10.1541/ieejjia.22008018