Advanced atomic force microscopy techniques II

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Bibliographic Details
Published inBeilstein journal of nanotechnology Vol. 5; no. 1; pp. 2326 - 2327
Main Authors Glatzel, Thilo, Garcia, Ricardo, Schimmel, Thomas
Format Journal Article
LanguageEnglish
Published Germany Beilstein Institute 03.12.2014
Beilstein-Institut
Subjects
AFM
Nanoscience
Nanotechnology
AFM
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Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
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ISSN:2190-4286
2190-4286
DOI:10.3762/bjnano.5.241