Advanced atomic force microscopy techniques II

Saved in:
Bibliographic Details
Published inBeilstein journal of nanotechnology Vol. 5; no. 1; pp. 2326 - 2327
Main Authors Glatzel, Thilo, Garcia, Ricardo, Schimmel, Thomas
Format Journal Article
LanguageEnglish
Published Germany Beilstein Institute 03.12.2014
Beilstein-Institut
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:2190-4286
2190-4286
DOI:10.3762/bjnano.5.241