Estimating the posterior probability of LTP failure by sequential Bayesian analysis of an imperfect Bernoulli trial model

A tetanically stimulated (TS) neuron is said to have failed to fire if its voltage-clamped excitatory postsynaptic current (EPSC) measurement is devoid of a long-term potentiation (LTP) response. This paper provides a method for evaluating the posterior probability of "failure" for TS neur...

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Bibliographic Details
Published inIEEE transactions on biomedical engineering Vol. 48; no. 6; pp. 670 - 683
Main Author Bishop, W.B.
Format Journal Article
LanguageEnglish
Published New York, NY IEEE 01.06.2001
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:A tetanically stimulated (TS) neuron is said to have failed to fire if its voltage-clamped excitatory postsynaptic current (EPSC) measurement is devoid of a long-term potentiation (LTP) response. This paper provides a method for evaluating the posterior probability of "failure" for TS neurons. A sequential Bayes algorithm is employed on an imperfect Bernoulli trial model to refine the posterior with each EPSC data record processed. The method is applied to both real and simulated LTP data and is shown to be consistent with the theoretical Beta-distributed posterior and the reported in vitro voltage-damped EPSC failure rates.
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ISSN:0018-9294
1558-2531
DOI:10.1109/10.923785