Role of a 193 nm ArF Excimer Laser in Laser-Assisted Plasma-Enhanced Chemical Vapor Deposition of SiNx for Low Temperature Thin Film Encapsulation

• Published in: Micromachines (Basel) Vol. 11; no. 1; p. 88
• Main Authors: An, Kunsik, Lee, Ho-Nyun, Cho, Kwan Hyun, Lee, Seung-Woo, Hwang, David J., Kang, Kyung-Tae
• Format: Journal Article
• Language: English
• Published: Basel MDPI AG 01.01.2020; MDPI
• Subjects: Ammonia; arf excimer laser; Chemical vapor deposition; Decomposition; Decomposition reactions; Encapsulation; Energy; Excimer lasers; Excimers; Gases; Illumination; laser assisted plasma enhanced chemical vapor deposition; Laser beams; Lasers; Low temperature; low temperature encapsulation; Performance evaluation; Photolysis; Plasma; Plasma enhanced chemical vapor deposition; Plasma generators; Polyethylene naphthalate; silane photolysis; Silicon nitride; Silicon wafers; Substrates; Thin films; Water vapor; United States > US
• ISSN: 2072-666X; 2072-666X
• DOI: 10.3390/mi11010088

In this study, silicon nitride thin films are deposited on organic polyethylene-naphthalate (PEN) substrates by laser assisted plasma enhanced chemical vapor deposition (LAPECVD) at a low temperature (150 °C) for the purpose of evaluating the encapsulation performance. A plasma generator is placed above the sample stage as conventional plasma enhanced chemical vapor deposition (PECVD) configuration, and the excimer laser beam of 193 nm wavelength illuminated in parallel to the sample surface is coupled to the reaction zone between the sample and plasma source. Major roles of the laser illumination in LAPECVD process are to compete with or complement the plasma decomposition of reactant gases. While a laser mainly decomposes ammonia molecules in the plasma, it also contributes to the photolysis of silane in the plasma state, possibly through the resulting hydrogen radicals and the excitation of intermediate disilane products. It will also be shown that the LAPECVD with coupled laser illumination of 193 nm wavelength improves the deposition rate of silicon nitride thin film, and the encapsulation performance evaluated via the measurement of water vapor transmission rate (WVTR).