Benchmarking of electro-optic monitors for femtosecond electron bunches

The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the c...

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Published inPhysical review letters Vol. 99; no. 16; p. 164801
Main Authors Berden, G, Gillespie, W A, Jamison, S P, Knabbe, E-A, MacLeod, A M, van der Meer, A F G, Phillips, P J, Schlarb, H, Schmidt, B, Schmüser, P, Steffen, B
Format Journal Article
LanguageEnglish
Published United States 19.10.2007
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Summary:The longitudinal profiles of ultrashort relativistic electron bunches at the soft x-ray free-electron laser FLASH have been investigated using two single-shot detection schemes: an electro-optic (EO) detector measuring the Coulomb field of the bunch and a radio-frequency structure transforming the charge distribution into a transverse streak. A comparison permits an absolute calibration of the EO technique. EO signals as short as 60 fs (rms) have been observed, which is a new record in the EO detection of single electron bunches and close to the limit given by the EO material properties.
ISSN:0031-9007
DOI:10.1103/physrevlett.99.164801