The structure and properties of sputter-deposited Co-Si alloy thin films

The structural and magnetic properties of Co sub 1-x Si sub x alloy thin films in the composition range 0 < x < 0.9 are investigated. The sputter-deposited thin films show a single phase hcp structure up to X approx = 0.25. For Si compositions beyond this, but with x < 0.6, electron diffrac...

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Published inJournal of physics. Condensed matter Vol. 12; no. 17; pp. 4075 - 4089
Main Authors Fallon, J M, Faunce, C A, Grundy, P J
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.05.2000
Institute of Physics
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Summary:The structural and magnetic properties of Co sub 1-x Si sub x alloy thin films in the composition range 0 < x < 0.9 are investigated. The sputter-deposited thin films show a single phase hcp structure up to X approx = 0.25. For Si compositions beyond this, but with x < 0.6, electron diffraction implies a single amorphous phase with features in the diffraction patterns typical of a dense random packing of hard spheres (DHRPS). These alloys are ferromagnetic. For 0.6 < x < 0.8 additional diffraction maxima are observed that suggest the formation of at least two amorphous phases. Magnetic measurements suggest the presence of thermally unstable magnetic particles. For x > 0.7-0.8, Co atoms are incorporated in the covalent random network structure of Si and paramagnetism is observed. A correlation of the PEELS Co L sub 2 /L sub 3 edge loss intensity ratio with the effective Co moment suggests that the magnetic changes could arise from differing local environments as Si is added, rather than a change in the particle size. Compositional mapping shows that some of the films have a composition that is not spatially uniform.
Bibliography:ObjectType-Article-2
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ISSN:0953-8984
1361-648X
DOI:10.1088/0953-8984/12/17/313