Analytical simulation of RBS spectra of nanowire samples

Almost all, if not all, general purpose codes for analysis of Ion Beam Analysis data have been originally developed to handle laterally homogeneous samples only. This is the case of RUMP, NDF, SIMNRA, and even of the Monte Carlo code Corteo. General-purpose codes usually include only limited support...

Full description

Saved in:
Bibliographic Details
Published inNuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 371; pp. 116 - 120
Main Authors Barradas, Nuno P., García Núñez, C., Redondo-Cubero, A., Shen, G., Kung, P., Pau, J.L.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 15.03.2016
Subjects
Analytical techniques
Computer simulation
Inhomogeneity
Mathematical analysis
Monte Carlo methods
Nanowires
NDF
RBS
Simulation
Spectra
Substrates
ZnO
NDF
RBS
ZnO
Nanowires
Simulation
Online AccessGet full text

Cover

More Information
Summary:Almost all, if not all, general purpose codes for analysis of Ion Beam Analysis data have been originally developed to handle laterally homogeneous samples only. This is the case of RUMP, NDF, SIMNRA, and even of the Monte Carlo code Corteo. General-purpose codes usually include only limited support for lateral inhomogeneity. In this work, we show analytical simulations of samples that consist of a layer of parallel oriented nanowires on a substrate, using a model implemented in NDF. We apply the code to real samples, made of vertical ZnO nanowires on a sapphire substrate. Two configurations of the nanowires were studied: 40nm diameter, 4.1μm height, 3.5% surface coverage; and 55nm diameter, 1.1μm height, 42% surface coverage. We discuss the accuracy and limits of applicability of the analysis.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:0168-583X
1872-9584
DOI:10.1016/j.nimb.2015.08.080