A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies
We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-96...
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| Published in | Review of scientific instruments Vol. 83; no. 10; p. 103105 |
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| Main Authors | , , , , , , , , , , , , , , , , |
| Format | Journal Article |
| Language | English |
| Published |
United States
01.10.2012
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| Online Access | Get more information |
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| Abstract | We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated. |
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| AbstractList | We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated. |
| Author | Szlachetko, J Dousse, J-Cl David, C Nachtegaal, M Szlachetko, M Jagodzinski, P van Bokhoven, J A Bergamaschi, A de Boni, E Hoszowska, J Sa, J Schmitt, B Smolentsev, G Kayser, Y Safonova, O Lücke, A Willimann, M |
| Author_xml | – sequence: 1 givenname: J surname: Szlachetko fullname: Szlachetko, J email: jakub.szlachetko@psi.ch organization: Paul Scherrer Institut, 5232 Villigen PSI, Switzerland. jakub.szlachetko@psi.ch – sequence: 2 givenname: M surname: Nachtegaal fullname: Nachtegaal, M – sequence: 3 givenname: E surname: de Boni fullname: de Boni, E – sequence: 4 givenname: M surname: Willimann fullname: Willimann, M – sequence: 5 givenname: O surname: Safonova fullname: Safonova, O – sequence: 6 givenname: J surname: Sa fullname: Sa, J – sequence: 7 givenname: G surname: Smolentsev fullname: Smolentsev, G – sequence: 8 givenname: M surname: Szlachetko fullname: Szlachetko, M – sequence: 9 givenname: J A surname: van Bokhoven fullname: van Bokhoven, J A – sequence: 10 givenname: J-Cl surname: Dousse fullname: Dousse, J-Cl – sequence: 11 givenname: J surname: Hoszowska fullname: Hoszowska, J – sequence: 12 givenname: Y surname: Kayser fullname: Kayser, Y – sequence: 13 givenname: P surname: Jagodzinski fullname: Jagodzinski, P – sequence: 14 givenname: A surname: Bergamaschi fullname: Bergamaschi, A – sequence: 15 givenname: B surname: Schmitt fullname: Schmitt, B – sequence: 16 givenname: C surname: David fullname: David, C – sequence: 17 givenname: A surname: Lücke fullname: Lücke, A |
| BackLink | https://www.ncbi.nlm.nih.gov/pubmed/23126749$$D View this record in MEDLINE/PubMed |
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