A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

• Published in: Review of scientific instruments Vol. 83; no. 10; p. 103105
• Main Authors: Szlachetko, J, Nachtegaal, M, de Boni, E, Willimann, M, Safonova, O, Sa, J, Smolentsev, G, Szlachetko, M, van Bokhoven, J A, Dousse, J-Cl, Hoszowska, J, Kayser, Y, Jagodzinski, P, Bergamaschi, A, Schmitt, B, David, C, Lücke, A
• Format: Journal Article
• Language: English
• Published: United States 01.10.2012
• ISSN: 1089-7623
• DOI: 10.1063/1.4756691

We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.