Charge transport mechanism in dielectrics: drift and diffusion of trapped charge carriers

In this study, we developed a continuum theory of the charge transport in dielectrics by trapped electrons and holes, which takes into account two separate contributions of the current of trapped charge carriers: the drift part and the diffusion one. It was shown that drift current is mostly dominan...

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Bibliographic Details
Published inScientific reports Vol. 10; no. 1; p. 15759
Main Authors Pil’nik, Andrey A., Chernov, Andrey A., Islamov, Damir R.
Format Journal Article
LanguageEnglish
Published London Nature Publishing Group UK 25.09.2020
Subjects
639/766/1130/2798
639/925/927/1007
Humanities and Social Sciences
multidisciplinary
Science
Science (multidisciplinary)
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Summary:In this study, we developed a continuum theory of the charge transport in dielectrics by trapped electrons and holes, which takes into account two separate contributions of the current of trapped charge carriers: the drift part and the diffusion one. It was shown that drift current is mostly dominant in the bulk, while the diffusion one reaches significant values near contacts. A comparison with other theoretical models and experiments shows a good agreement. The model can be extended to two- and three-dimensional systems. The developed model, formulated in partial differential equations, can be numerically implemented in the finite element method code.
Bibliography:ObjectType-Article-1
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ISSN:2045-2322
2045-2322
DOI:10.1038/s41598-020-72615-1