Analysis of X-ray images and spectra (aXis2000): A toolkit for the analysis of X-ray spectromicroscopy data

• Published in: Journal of electron spectroscopy and related phenomena Vol. 266; no. C; p. 147360
• Main Author: Hitchcock, Adam P.
• Format: Journal Article
• Language: English
• Published: United States Elsevier B.V 01.07.2023; Elsevier
• Subjects: AXis2000; AXis2000STXM; Chemical mapping; INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; Polarization mapping; Spectromicroscopy data analysis package; Spectroscopy; STXM; Polarization mapping; STXM; Chemical mapping; AXis2000; Spectromicroscopy data analysis package
• ISSN: 0368-2048; 1873-2526
• DOI: 10.1016/j.elspec.2023.147360

Spectromicroscopy refers to analytical methods that combine imaging and spectroscopy to provide detailed, spatially resolved analytical information about a sample, such as the type and quantitative spatial distributions of chemical components, geometric or magnetic alignment information, crystal structure, etc. The analysis of X-ray images and spectra (aXis2000) software described in this work provides a set of routines within a single, integrated, graphical-oriented package to read, display, manipulate and analyze spectromicroscopy data, with particular focus on soft X-ray spectromicroscopy methods such as scanning transmission X-ray microscopy (STXM), X-ray photoemission electron microscopy (XPEEM), scanning photoelectron X-ray microscopy (SPEM) and transmission X-ray microscopy (TXM). Here, this free software is described and compared to other software that can provide similar or complementary capabilities. Examples of spectromicroscopic analyses using advanced features of aXis2000 are provided. •aXis2000, a software package for analysis of spectromicroscopy data analysis is described.•Details on how to access and use are provided.•Examples of use of aXis2000 for hyperspectral 3D and 4D data analysis are given.•Data sets and sample analyses are provided in supplemental information.