Fermi surface contours obtained from scanning tunneling microscope images around surface point defects

We present a theoretical analysis of the standing wave patterns in scanning tunneling microscope (STM) images, which occur around surface point defects. We consider arbitrary dispersion relations for the surface states and calculate the conductance for a system containing a small-size tunnel contact...

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Bibliographic Details
Published inNew journal of physics Vol. 15; no. 12; pp. 123013 - 17
Main Authors Khotkevych-Sanina, N V, Kolesnichenko, Yu A, van Ruitenbeek, J M
Format Journal Article
LanguageEnglish
Published IOP Publishing 09.12.2013
Subjects
Contours
Dispersions
Microscopes
Point defects
Scanning
Scanning tunneling microscopy
Tunneling
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Summary:We present a theoretical analysis of the standing wave patterns in scanning tunneling microscope (STM) images, which occur around surface point defects. We consider arbitrary dispersion relations for the surface states and calculate the conductance for a system containing a small-size tunnel contact and a surface impurity. We find rigorous theoretical relations between the interference patterns in the real-space STM images, their Fourier transforms and the Fermi contours of two-dimensional electrons. We propose a new method for reconstructing Fermi contours of surface electron states, directly from the real-space STM images around isolated surface defects.
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ISSN:1367-2630
1367-2630
DOI:10.1088/1367-2630/15/12/123013