The crystallization of thin Ni-Zr alloys observed in the diffraction mode of an electron microscope

The results are presented of amorphous thin Ni-Zr alloy films. The alloys were prepared by the sputter-deposition technique over the continuous composition range Ni sub 92.7 Zr sub 7.3 to Ni sub 20.7 Zr sub 79.3 . The samples were heated in the electron microscope incorporating the microscope heatin...

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Bibliographic Details
Published inJournal of physics. D, Applied physics Vol. 27; no. 1; pp. 129 - 132
Main Authors Idrus, R M, Grundy, P J
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 14.01.1994
Institute of Physics
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Summary:The results are presented of amorphous thin Ni-Zr alloy films. The alloys were prepared by the sputter-deposition technique over the continuous composition range Ni sub 92.7 Zr sub 7.3 to Ni sub 20.7 Zr sub 79.3 . The samples were heated in the electron microscope incorporating the microscope heating stage and crystallization was viewed through the diffraction mode. The average grain sizes of the microstructure after cooling to room temperature were measured. It was found that there was no enhancement of the crystallization temperature, T sub x , in the region of the eutectics and that the compositional dependence of crystallization temperature bore no relation to features of the equilibrium phase diagram. Comparison of T sub x of thin alloys with that of sputtered 5 mu m thick alloys heated in the differential scanning calorimeter yielded inconclusive results from the temperature-thickness relationship. Results of T sub x from some melt-quench alloys are also compared with the present data.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:0022-3727
1361-6463
DOI:10.1088/0022-3727/27/1/019