Ptychographic imaging for the characterization of X-ray free-electron laser beams

We present some preliminary results from a study aimed at the characterization of the wavefront of X-ray free electron laser (XFEL) beams in the same operation conditions as for single particle imaging (or flash X-ray imaging) experiments. The varying illumination produced by wavefront fluctuations...

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Published inJournal of physics. Conference series Vol. 849; no. 1; pp. 12032 - 12035
Main Authors Sala, S, Daurer, BJ, Hantke, MF, Ekeberg, T, Loh, ND, Maia, FRNC, Thibault, P
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.06.2017
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Summary:We present some preliminary results from a study aimed at the characterization of the wavefront of X-ray free electron laser (XFEL) beams in the same operation conditions as for single particle imaging (or flash X-ray imaging) experiments. The varying illumination produced by wavefront fluctuations between several pulses leads to a partially coherent average beam which can be decomposed into several coherent modes using ptychographic reconstruction algorithms. Such a decomposition can give insight into pulse-to-pulse variations of the wavefront. We discuss data collected at the Linac Coherent Light Source (LCLS) and FERMI.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/849/1/012032