Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their so...

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Published inApplied surface science advances Vol. 19; no. C; p. 100534
Main Authors Pinder, Joshua W., Major, George H., Baer, Donald R., Terry, Jeff, Whitten, James E., Čechal, Jan, Crossman, Jacob D., Lizarbe, Alvaro J., Jafari, Samira, Easton, Christopher D., Baltrusaitis, Jonas, van Spronsen, Matthijs A., Linford, Matthew R.
Format Journal Article
LanguageEnglish
Published Netherlands Elsevier B.V 01.02.2024
Elsevier
Subjects
Common errors
Data collection
Reporting
X-ray photoelectron spectroscopy
XPS
Common errors
Data collection
XPS
Reporting
X-ray photoelectron spectroscopy
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Abstract Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.
AbstractList Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.
ArticleNumber 100534
Author Whitten, James E.
Čechal, Jan
Crossman, Jacob D.
Terry, Jeff
Jafari, Samira
Pinder, Joshua W.
Baer, Donald R.
Easton, Christopher D.
Linford, Matthew R.
Baltrusaitis, Jonas
Major, George H.
Lizarbe, Alvaro J.
van Spronsen, Matthijs A.
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  givenname: George H.
  surname: Major
  fullname: Major, George H.
  organization: Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, United States
– sequence: 3
  givenname: Donald R.
  surname: Baer
  fullname: Baer, Donald R.
  organization: Pacific Northwest National Laboratory, Physical and Computational Sciences, P.O. Box 999, Richland, WA 99352, United States
– sequence: 4
  givenname: Jeff
  surname: Terry
  fullname: Terry, Jeff
  organization: Illinois Institute of Technology, 3101 S. Dearborn St., Chicago, IL 60616, United States
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  surname: Whitten
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  givenname: Jacob D.
  surname: Crossman
  fullname: Crossman, Jacob D.
  organization: Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, United States
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  givenname: Alvaro J.
  surname: Lizarbe
  fullname: Lizarbe, Alvaro J.
  organization: Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, United States
– sequence: 9
  givenname: Samira
  surname: Jafari
  fullname: Jafari, Samira
  organization: Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, United States
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  surname: Baltrusaitis
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  givenname: Matthijs A.
  surname: van Spronsen
  fullname: van Spronsen, Matthijs A.
  organization: Diamond Light Source, Oxfordshire, Didcot OX11 0DE, UK
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  givenname: Matthew R.
  orcidid: 0000-0003-0460-041X
  surname: Linford
  fullname: Linford, Matthew R.
  email: mrlinford@chem.byu.edu
  organization: Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, United States
BackLink https://www.osti.gov/biblio/2279097$$D View this record in Osti.gov
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Data collection
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X-ray photoelectron spectroscopy
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Snippet Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition,...
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SubjectTerms Common errors
Data collection
Reporting
X-ray photoelectron spectroscopy
XPS
Title Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters
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https://www.osti.gov/biblio/2279097
https://doaj.org/article/043c0df989af4c78811d052c13777431
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