Avoiding common errors in X-ray photoelectron spectroscopy data collection and analysis, and properly reporting instrument parameters

• Published in: Applied surface science advances Vol. 19; no. C; p. 100534
• Main Authors: Pinder, Joshua W., Major, George H., Baer, Donald R., Terry, Jeff, Whitten, James E., Čechal, Jan, Crossman, Jacob D., Lizarbe, Alvaro J., Jafari, Samira, Easton, Christopher D., Baltrusaitis, Jonas, van Spronsen, Matthijs A., Linford, Matthew R.
• Format: Journal Article
• Language: English
• Published: Netherlands Elsevier B.V 01.02.2024; Elsevier
• Subjects: Common errors; Data collection; Reporting; X-ray photoelectron spectroscopy; XPS; Common errors; Data collection; XPS; Reporting; X-ray photoelectron spectroscopy
• ISSN: 2666-5239; 2666-5239
• DOI: 10.1016/j.apsadv.2023.100534

Despite numerous tutorials and standards written to the technical community on X-ray photoelectron spectroscopy (XPS), difficulties with data acquisition, analysis, and reporting persist. This work focuses on common errors in XPS that are frequently observed in the scientific literature and their sources. Indeed, this work covers: (i) XPS data collection, initial data analysis, and data presentation, (ii) Handling XPS backgrounds, (iii) Common errors in XPS peak fitting, and (iv) XPS data presentation and reporting. Graphical examples of errors and appropriate ways of handling data and correcting errors are provided. Additional readings are listed for greater in-depth exploration of the subjects discussed.