Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: development of a novel sample-holder

We introduce an experimental facility dedicated to surface science that combines Low-Energy Electron Microscopy/Photo-Electron Emission Microscopy (LEEM/PEEM) and variable-temperature Scanning Probe Microscopy techniques. A technical challenge has been to design a sample-holder that allows to exploi...

Full description

Saved in:
Bibliographic Details
Published inReview of scientific instruments Vol. 85; no. 4; p. 043705
Main Authors Cheynis, F, Leroy, F, Ranguis, A, Detailleur, B, Bindzi, P, Veit, C, Bon, W, Müller, P
Format Journal Article
LanguageEnglish
Published United States 01.04.2014
Online AccessGet more information

Cover

More Information
Summary:We introduce an experimental facility dedicated to surface science that combines Low-Energy Electron Microscopy/Photo-Electron Emission Microscopy (LEEM/PEEM) and variable-temperature Scanning Probe Microscopy techniques. A technical challenge has been to design a sample-holder that allows to exploit the complementary specifications of both microscopes and to preserve their optimal functionality. Experimental demonstration is reported by characterizing under ultrahigh vacuum with both techniques: Au(111) surface reconstruction and a two-layer thick graphene on 6H-SiC(0001). A set of macros to analyze LEEM/PEEM data extends the capabilities of the setup.
ISSN:1089-7623
DOI:10.1063/1.4871437