Three-dimensional measurement of composition changes in InAs/GaAs quantum dots

We present a transmission electron microscope (TEM) analysis of InAs/GaAs quantum dots (QDs) which have been subject to thermal annealing. Annealing produces a significant shift in infrared detector response to longer wavelengths, indicating changes in QD size, composition, or both. A three-dimensio...

Full description

Saved in:
Bibliographic Details
Published inJournal of physics. Conference series Vol. 326; no. 1; pp. 012048 - 4
Main Authors Wahra, A, Tan, C -H, Xie, J, Vines, P, Beanland, R
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 09.11.2011
Subjects
Online AccessGet full text

Cover

Loading…
More Information
Summary:We present a transmission electron microscope (TEM) analysis of InAs/GaAs quantum dots (QDs) which have been subject to thermal annealing. Annealing produces a significant shift in infrared detector response to longer wavelengths, indicating changes in QD size, composition, or both. A three-dimensional reconstruction of an 'average' QD is obtained by combining compositionally-sensitive dark field 002 TEM images of many QDs, followed by fitting to a structural model assuming cylindrical symmetry. Errors in compositional measurements are estimated, and the validity of the model is assessed by TEM image simulations using 2-beam dynamical electron diffraction theory. As-grown material exhibits an increasing concentration of In towards the top of the QDs, whereas annealed material shows diffusion of indium from the upper part of the QD towards the sides and base. There is no measurable change in the position of the outer interface of the QD.
Bibliography:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
content type line 23
ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/326/1/012048