A highly oriented conductive MOF thin film-based Schottky diode for self-powered light and gas detection
The application of Schottky junction in self-powered devices is limited by low efficiency in both separation and transport of photogenerated electrons/holes. This issue may be overcome by introducing electronically conductive metal-organic framework (EC-MOF) materials into the junction and limited b...
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Published in | Journal of materials chemistry. A, Materials for energy and sustainability Vol. 8; no. 18; pp. 985 - 99 |
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Main Authors | , , , , , , |
Format | Journal Article |
Language | English |
Published |
Cambridge
Royal Society of Chemistry
12.05.2020
|
Subjects | |
Online Access | Get full text |
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Summary: | The application of Schottky junction in self-powered devices is limited by low efficiency in both separation and transport of photogenerated electrons/holes. This issue may be overcome by introducing electronically conductive metal-organic framework (EC-MOF) materials into the junction and limited by preparing high-quality thin films of EC-MOFs. In this study, for the first time, high-quality EC-MOF thin films were demonstrated as effective interlayer materials to solve the above-mentioned issue by modulating the height of Schottky barrier (
Φ
B
). The EC-MOF-based self-powered Schottky diode can act as a photodetector and demonstrate the highest external quantum efficiency (84%) for all reported self-powered photodetectors as well as the broadest detectable spectrum range (250 to 1500 nm), high on-off ratio (∼10
3
) and short rise (0.007 s) and fall time (0.03 s). Furthermore, it can be used as a gas sensor for typical harmful gases and vapors.
High-quality EC-MOF thin films are used to modulate the Schottky barrier height and detect light/gas by self-powered mode. |
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Bibliography: | 10.1039/d0ta01379j Electronic supplementary information (ESI) available. See DOI ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 |
ISSN: | 2050-7488 2050-7496 2050-7496 |
DOI: | 10.1039/d0ta01379j |