Fabrication and Properties of Silicon-Based PLZT Thin Films for MFSFET Applications
Fabrication and properties of lanthanum-modified lead zirconate titanate (PLZT) thin films have been studied for Metal-Ferroelectric-Semiconductor FET (MFSFET) devices. PLZT based MFS capacitors using lead titanate (PT) as seeding layers have been respectively prepared on p-type ⟨111⟩ and n-type ⟨10...
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Published in | Integrated ferroelectrics Vol. 61; no. 1; pp. 189 - 195 |
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Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Taylor & Francis Group
01.08.2004
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Subjects | |
Online Access | Get full text |
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Summary: | Fabrication and properties of lanthanum-modified lead zirconate titanate (PLZT) thin films have been studied for Metal-Ferroelectric-Semiconductor FET (MFSFET) devices. PLZT based MFS capacitors using lead titanate (PT) as seeding layers have been respectively prepared on p-type ⟨111⟩ and n-type ⟨100⟩ silicon wafers directly by a sol-gel method. PLZT films are final annealed at 650°C for 1 min in oxygen ambient using rapid thermal annealing (RTA). The measured memory windows of the MFS capacitors based on p-type silicon wafer are about 2.0 V and 4.2 V under the polarization voltages of ±5 V and ±10 V, and the measured memory windows of the MFS capacitors based on n-type Silicon wafer are about 0.3 V and 1.5 V under the polarization voltages of ±5 V and ±10 V correspondingly. The MFS structures based on p-type silicon wafer can be valuable for MFSFET applications. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1058-4587 1607-8489 |
DOI: | 10.1080/10584580490459233 |