Powder diffraction crystal structure analysis using derivative difference minimization: example of the potassium salt of 1-(tetrazol-5-yl)-2-nitroguanidine

The crystal structure of the potassium salt of 1‐(tetrazol‐5‐yl)‐2‐nitroguanidine [K(C2H3N8O2)] was solved and refined from X‐ray powder diffraction data by applying the derivative difference minimization (DDM) method. The compound is of interest as an energetic substance. The structure model was fo...

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Published inActa crystallographica. Section B, Structural science Vol. 61; no. 4; pp. 435 - 442
Main Authors Astachov, A. M., Molokeev, M. S., Vasiliev, A. D., Solovyov, Leonid A.
Format Journal Article
LanguageEnglish
Russian
Published 5 Abbey Square, Chester, Cheshire CH1 2HU, England Munksgaard International Publishers 01.08.2005
Blackwell
Blackwell Publishing Ltd
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Summary:The crystal structure of the potassium salt of 1‐(tetrazol‐5‐yl)‐2‐nitroguanidine [K(C2H3N8O2)] was solved and refined from X‐ray powder diffraction data by applying the derivative difference minimization (DDM) method. The compound is of interest as an energetic substance. The structure model was found from a Patterson search. The reflection intensities for the Patterson synthesis were derived from the powder profile by applying a newly developed DDM‐based profile decomposition procedure. The use of the DDM method allowed successful location and unconstrained refinement of all the atomic positions, including those of three independent H atoms. The advantages of DDM in terms of the precision and reproducibility of the structural parameters are discussed in comparison to Rietveld refinement results. The failure to refine the H‐atom positions by the Rietveld method was attributed to systematic errors associated with the background modelling, which are avoided by DDM.
Bibliography:istex:ABF476542A5CF451FAFACAECBE2AD6BFAD8A6403
ark:/67375/WNG-4HQGSX07-L
ArticleID:AYBSN5019
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:0108-7681
2052-5192
1600-5740
2052-5206
DOI:10.1107/S0108768105015004