Molecular dynamics study on the nano-void growth in face-centered cubic single crystal copper

• Published in: Computational materials science Vol. 46; no. 3; pp. 749 - 754
• Main Authors: Zhao, K.J., Chen, C.Q., Shen, Y.P., Lu, T.J.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01.09.2009; Elsevier
• Subjects: Condensed matter: structure, mechanical and thermal properties; Deformation and plasticity (including yield, ductility, and superplasticity); Exact sciences and technology; Incipient yielding; Mechanical and acoustical properties of condensed matter; Mechanical properties of solids; Molecular dynamics; Nano-void growth; Physics; Single crystal copper; Size effect; Nano-void growth; 02.70.Ns; 62.20.de; 62.20.fg; Incipient yielding; Size effect; Molecular dynamics; Single crystal copper; 61.72.Ff; 61.72.Qq; Cubic lattices; Volume fraction; Uniaxial tension stress; Molecular dynamics method; Stress-strain relations; Cavitation; Dislocations; Young modulus; Nanometer scale; Monocrystals; Atomistic model; Yield strength; Embedded atom method; Copper
• ISSN: 0927-0256; 1879-0801
• DOI: 10.1016/j.commatsci.2009.04.034

Cylindrical nano-void growth in face-centered cubic single crystal copper is studied by mean of molecular dynamics with the Embedded Atom Method. The problem is modeled by a periodic unit cell containing a centered nano-sized cylindrical hole subject to uniaxial tension. The effects of the cell size, crystalline orientation, and initial void volume fraction on the macroscopic stress–strain curve, incipient yield strength, and macroscopic effective Young’s modulus are quantified. Defect evolution in terms of dislocation emission immediately after incipient yielding is also investigated. Obtained results show that, for a given void volume fraction, cell size has apparent effects on the incipient yield strength but negligible effects on the macroscopic effective Young’s modulus. Moreover, the macroscopic effective Young’s modulus and incipient yield strength of the [ 1 ¯ 1 0]–[1 1 1]–[1 1 2 ¯ ] orientated system are found to be much more sensitive to the presence of void than those of the [1 0 0]–[0 1 0]–[0 0 1] system.