A low temperature nonlinear optical rotational anisotropy spectrometer for the determination of crystallographic and electronic symmetries

• Published in: Review of scientific instruments Vol. 85; no. 8; p. 083102
• Main Authors: Torchinsky, Darius H, Chu, Hao, Qi, Tongfei, Cao, Gang, Hsieh, David
• Format: Journal Article
• Language: English
• Published: United States 01.08.2014
• ISSN: 1089-7623
• DOI: 10.1063/1.4891417

Nonlinear optical generation from a crystalline material can reveal the symmetries of both its lattice structure and underlying ordered electronic phases and can therefore be exploited as a complementary technique to diffraction based scattering probes. Although this technique has been successfully used to study the lattice and magnetic structures of systems such as semiconductor surfaces, multiferroic crystals, magnetic thin films, and multilayers, challenging technical requirements have prevented its application to the plethora of complex electronic phases found in strongly correlated electron systems. These requirements include an ability to probe small bulk single crystals at the μm length scale, a need for sensitivity to the entire nonlinear optical susceptibility tensor, oblique light incidence reflection geometry, and incident light frequency tunability among others. These measurements are further complicated by the need for extreme sample environments such as ultra low temperatures, high magnetic fields, or high pressures. In this review we present a novel experimental construction using a rotating light scattering plane that meets all the aforementioned requirements. We demonstrate the efficacy of our scheme by making symmetry measurements on a μm scale facet of a small bulk single crystal of Sr2IrO4 using optical second and third harmonic generation.