Identification of fatigue crack growth mechanisms in IN100 superalloy as a function of temperature and frequency
ABSTRACT A study is undertaken to investigate the fatigue crack growth rate properties of polycrystalline IN100 through the identification of crack growth mechanisms as a function of temperature, frequency and ΔK. An additional goal is to determine the stress free activation energy of IN100. Constan...
Saved in:
Published in | Fatigue & fracture of engineering materials & structures Vol. 36; no. 3; pp. 217 - 227 |
---|---|
Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
Oxford, UK
Blackwell Publishing Ltd
01.03.2013
Blackwell Wiley Subscription Services, Inc |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | ABSTRACT
A study is undertaken to investigate the fatigue crack growth rate properties of polycrystalline IN100 through the identification of crack growth mechanisms as a function of temperature, frequency and ΔK. An additional goal is to determine the stress free activation energy of IN100. Constant amplitude, load controlled tests are performed at room temperature (22 °C), 316 °C, 482 °C and 649 °C under two different loading frequencies of 20 and 0.33 Hz. These specimens are then analysed via scanning electron microscopy (SEM) to determine failure mechanisms. SEM shows that, as temperature increased from room temperature to 649 °C, the fracture mechanism transitions from transgranular to intergranular. The fracture mechanism is shown to transition from intergranular to transgranular at elevated temperatures as da/dN increases as a result of growing ΔK. Scanning electron microscopy shows that, as frequency decreases from 20 to 0.33 Hz at 649 °C, the fracture mechanism transitions from transgranular to intergranular. |
---|---|
Bibliography: | istex:021A1BF2A3C11216522639F023DF20D579FE5BBD ArticleID:FFE1715 ark:/67375/WNG-TDZF231W-1 ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 8756-758X 1460-2695 |
DOI: | 10.1111/j.1460-2695.2012.01715.x |