Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy

• Published in: Chemical communications (Cambridge, England) Vol. 52; no. 53; pp. 8227 - 823
• Main Authors: Su, Weitao, Kumar, Naresh, Dai, Ning, Roy, Debdulal
• Format: Journal Article
• Language: English
• Published: England 01.01.2016
• Subjects: chemical compounds; chemical reactions; Defects; Devices; Graphene; Mapping; Nanostructure; Raman spectroscopy; Silver; Spatial resolution

Non-gap mode tip-enhanced Raman spectroscopy (TERS) is used for the first time to successfully map the intrinsic defects in single-layer graphene with 20 nm spatial resolution. The nanoscale Raman mapping is enabled by an unprecedented near-field to far-field signal contrast of 8.5 at the Ag-coated...