APA (7th ed.) Citation

Su, W., Kumar, N., Dai, N., & Roy, D. (2016). Nanoscale mapping of intrinsic defects in single-layer graphene using tip-enhanced Raman spectroscopy. Chemical communications (Cambridge, England), 52(53), 8227-823. https://doi.org/10.1039/c6cc01990k

Chicago Style (17th ed.) Citation

Su, Weitao, Naresh Kumar, Ning Dai, and Debdulal Roy. "Nanoscale Mapping of Intrinsic Defects in Single-layer Graphene Using Tip-enhanced Raman Spectroscopy." Chemical Communications (Cambridge, England) 52, no. 53 (2016): 8227-823. https://doi.org/10.1039/c6cc01990k.

MLA (9th ed.) Citation

Su, Weitao, et al. "Nanoscale Mapping of Intrinsic Defects in Single-layer Graphene Using Tip-enhanced Raman Spectroscopy." Chemical Communications (Cambridge, England), vol. 52, no. 53, 2016, pp. 8227-823, https://doi.org/10.1039/c6cc01990k.