Critical node lifetimes in random networks via the Chen-Stein method
This correspondence considers networks where nodes are connected randomly and can fail at random times. It provides scaling laws that allow to find the critical time at which isolated nodes begin to appear in the system as its size tends to infinity. Applications are in the areas of sensor and ad-ho...
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Published in | IEEE transactions on information theory Vol. 52; no. 6; pp. 2831 - 2837 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
New York, NY
IEEE
01.06.2006
Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subjects | |
Online Access | Get full text |
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Summary: | This correspondence considers networks where nodes are connected randomly and can fail at random times. It provides scaling laws that allow to find the critical time at which isolated nodes begin to appear in the system as its size tends to infinity. Applications are in the areas of sensor and ad-hoc networks where nodes are subject to battery drainage and 'blind spots' formation becomes a primary concern. The techniques adopted are based on the Chen-Stein method of Poisson approximation, which allows to obtain elegant derivations that are shown to improve upon and simplify previous related results that appeared in the literature. Since blind spots are strongly related to full connectivity, we also obtain some scaling results about the latter. |
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Bibliography: | SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 14 ObjectType-Article-1 ObjectType-Article-2 content type line 23 |
ISSN: | 0018-9448 1063-6692 1558-2566 |
DOI: | 10.1109/TIT.2006.874545 |