Analysis of Electron Beam Damage of Crystalline Pharmaceutical Materials by Transmission Electron Microscopy

We have studied the impact of transmission electron microscopy (TEM) and low dose electron diffraction on ten different crystalline pharmaceutical compounds, covering a diverse chemical space and with differing physical properties. The aim was to establish if particular chemical moieties were more s...

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Bibliographic Details
Published inJournal of physics. Conference series Vol. 644; no. 1; pp. 12038 - 12041
Main Authors S'ari, M, Cattle, J, Hondow, N, Blade, H, Cosgrove, S, Brydson, R M, Brown, A P
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 12.10.2015
Subjects
Chemical compounds
Crystal structure
Crystallinity
Damage
Diffraction patterns
Electron beams
Electron diffraction
Electrons
Pharmaceuticals
Physical properties
Physics
Structural stability
Transmission electron microscopy
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Summary:We have studied the impact of transmission electron microscopy (TEM) and low dose electron diffraction on ten different crystalline pharmaceutical compounds, covering a diverse chemical space and with differing physical properties. The aim was to establish if particular chemical moieties were more susceptible to damage within the electron beam. We have measured crystalline diffraction patterns for each and indexed nine out of ten of them. Characteristic electron dosages are reported for each material, with no apparent correlation between chemical structure and stability within the electron beam. Such low dose electron diffraction protocols are suitable for the study of pharmaceutical compounds.
ISSN:1742-6588
1742-6596
DOI:10.1088/1742-6596/644/1/012038