Electron Image Series Reconstruction of Twin Interfaces in InP Superlattice Nanowires

• Published in: Microscopy and microanalysis Vol. 17; no. 5; pp. 752 - 758
• Main Authors: Ek, Martin, Borgström, Magnus T., Karlsson, Lisa S., Hetherington, Crispin J.D., Wallenberg, L. Reine
• Format: Journal Article
• Language: English
• Published: New York, USA Cambridge University Press 01.10.2011; Oxford University Press
• Subjects: Astigmatism; Carbon; Chemical Sciences; Condensed Matter Physics; Crystal structure; Den kondenserade materiens fysik; Electrons; Fysik; Kemi; Microscopy; Nanowires; Natural Sciences; Naturvetenskap; Physical Sciences; twinning; indium phosphide; exit-wave reconstruction; transmission electron microscopy; nanowires; aberration correction
• ISSN: 1431-9276; 1435-8115; 1435-8115
• DOI: 10.1017/S1431927611000493

The twin interface structure in twinning superlattice InP nanowires with zincblende structure has been investigated using electron exit wavefunction restoration from focal series images recorded on an aberration-corrected transmission electron microscope. By comparing the exit wavefunction phase with simulations from model structures, it was possible to determine the twin structure to be the ortho type with preserved In-P bonding order across the interface. The bending of the thin nanowires away from the intended ⟨110⟩ axis could be estimated locally from the calculated diffraction pattern, and this parameter was successfully taken into account in the simulations.