PET surface modification by 0.2 keV and 2.5 keV argon ions
PET foils have a high potential as a material for biomedical and electrical industries. PET foils were irradiated by ions for variable irradiation time. The effects of low (2.5, 0.2 keV) energy argon ion flux irradiation on the surfaces of polyethylene terephthalate thin foils (PET) were studied. Th...
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Published in | IOP conference series. Materials Science and Engineering Vol. 12; no. 1; p. 012007 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
Bristol
IOP Publishing
01.01.2010
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Subjects | |
Online Access | Get full text |
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Summary: | PET foils have a high potential as a material for biomedical and electrical industries. PET foils were irradiated by ions for variable irradiation time. The effects of low (2.5, 0.2 keV) energy argon ion flux irradiation on the surfaces of polyethylene terephthalate thin foils (PET) were studied. The source of ions was an ECR Ion Gun with settable acceleration voltages. The modified foils were investigated by in-situ X-ray Photoelectron Spectroscopy (XPS) and ex-situ Fourier transform infrared spectroscopy (FTIR). The significant changes in the chemical composition of the surface layer were quantitatively studied by XPS. The scission of the chains in the surface layer of PET foil was induced by ion flux interaction with PET surface. The strong selective sputtering of oxygen atoms in PET film was observed. The atomic ratio O/C was decreased by 0.2keV and 2.5keV argon ion flux from 0.40 to 0.25 and 0.04 respectively. The oxygen atoms in ester bonds are detached first. This phenomenon is responsible for the creation of carbon-rich surface layer. The FTIR analyses identified changes in chemical composition but with no obvious correlation to surface changes. PET volume changes in the spectra were probably results of photons from the ion source influence on PET foils. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1757-899X 1757-8981 1757-899X |
DOI: | 10.1088/1757-899X/12/1/012007 |