RF Transconductor Linearization Robust to Process, Voltage and Temperature Variations

Software-defined radio receivers increasingly exploit linear RF V-I conversion, instead of RF voltage gain, to improve interference robustness. Unfortunately, the linearity of CMOS inverters, which are often used to implement V-I conversion, is highly sensitive to Process, Voltage and Temperature va...

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Published inIEEE journal of solid-state circuits Vol. 50; no. 11; pp. 2591 - 2602
Main Authors Kundur Subramaniyan, Harish, Klumperink, Eric A. M., Srinivasan, Venkatesh, Kiaei, Ali, Nauta, Bram
Format Journal Article
LanguageEnglish
Published New York IEEE 01.11.2015
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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Summary:Software-defined radio receivers increasingly exploit linear RF V-I conversion, instead of RF voltage gain, to improve interference robustness. Unfortunately, the linearity of CMOS inverters, which are often used to implement V-I conversion, is highly sensitive to Process, Voltage and Temperature variations. This paper proposes a more robust technique based on resistive degeneration. To mitigate third-order IM3 distortion induced by the quadratic MOSFET I-V characteristic, a new linearization technique is proposed which exploits a floating battery by-pass circuit and replica biasing to improve IIP3 in a robust way. This paper explains the concept and analyzes linearity improvement. To demonstrate operation, an LNTA with current domain mixer is implemented in a 45 nm CMOS process. Compared to a conventional inverter based LNTA with the same transconductance, it improves IIP3 from 2 dBm to a robust P IIP3 of 8 dBm at the cost of 67% increase in power consumption.
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ISSN:0018-9200
1558-173X
DOI:10.1109/JSSC.2015.2453964