Study of X‐ray topography using the super‐Borrmann effect

• Published in: Journal of synchrotron radiation Vol. 29; no. 5; pp. 1251 - 1257
• Main Authors: Matsui, J., Takatsu, K., Tsusaka, Y.
• Format: Journal Article
• Language: English
• Published: 5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.09.2022; John Wiley & Sons, Inc
• Subjects: Attenuation coefficients; Crystal dislocations; Research Papers; super-borrmann effect; Synchrotron radiation; Synchrotrons; Topography
• ISSN: 1600-5775; 0909-0495; 1600-5775
• DOI: 10.1107/S1600577522007779

X‐ray topography exerting the super‐Borrmann effect has been performed using synchrotron radiation to display dislocation images with a high‐speed and high‐resolution CMOS camera. Forward‐transmitted X‐rays are positively employed instead of reflected X‐rays to reveal dislocations in relatively thick crystals by simultaneously exciting a pair of adjacent {111} planes owing to the super‐Borrmann effect. Before the experiment, minimum values of the attenuation coefficients AminP for σ and π polarizations of the incident X‐rays in the three‐beam case are calculated. Results demonstrate that AminP for both polarizations are almost 20 times larger than those in the two‐beam (usual Borrmann effect) case. The transmitted X‐rays can be used to confirm the efficacy of taking topographs under the super‐Borrmann conditions, as well as under multiple‐diffraction conditions. Furthermore, super‐Borrmann topographs can be considered for relatively thick crystals, where a conventional Lang X‐ray topography technique is difficult to apply. X‐ray topography exerting the super‐Borrnann effect is realized using synchrotron radiation and a high‐resolution CMOS camera.