Angle-suppressed scattering and optical forces on submicrometer dielectric particles

We show that submicrometer silicon spheres, whose polarizabilities are completely given by their two first Mie coefficients, are an excellent laboratory to test effects of both angle-suppressed and resonant differential scattering cross sections. Specifically, outstanding scattering angular distribu...

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Published inJournal of the Optical Society of America. A, Optics, image science, and vision Vol. 28; no. 1; p. 54
Main Authors Nieto-Vesperinas, M, Gomez-Medina, R, Saenz, J J
Format Journal Article
LanguageEnglish
Published United States 01.01.2011
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Summary:We show that submicrometer silicon spheres, whose polarizabilities are completely given by their two first Mie coefficients, are an excellent laboratory to test effects of both angle-suppressed and resonant differential scattering cross sections. Specifically, outstanding scattering angular distributions, with zero forward- or backward-scattered intensity, (i.e., the so-called Kerker conditions), previously discussed for hypothetical magnetodielectric particles, are now observed for those Si objects in the near infrared. Interesting new consequences for the corresponding optical forces are derived from the interplay, both in and out of resonance, between the electric- and magnetic-induced dipoles.
ISSN:1520-8532
DOI:10.1364/josaa.28.000054