Impedance Spectroscopy of Encapsulated Single Graphene Layers

In this work, we demonstrate the use of electrical impedance spectroscopy (EIS) for the disentanglement of several dielectric contributions in encapsulated single graphene layers. The dielectric data strongly vary qualitatively with the nominal graphene resistance. In the case of sufficiently low re...

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Published inNanomaterials (Basel, Switzerland) Vol. 12; no. 5; p. 804
Main Authors Schmidt, Rainer, Carrascoso Plana, Félix, Nemes, Norbert Marcel, Mompeán, Federico, García-Hernández, Mar
Format Journal Article
LanguageEnglish
Published Switzerland MDPI AG 27.02.2022
MDPI
Subjects
Circuits
Dielectric strength
Electrical impedance
electrode resistance
Electrodes
Encapsulation
Equivalent circuits
Graphene
Impedance
Impedance spectroscopy
Interfaces
Low resistance
single-layer graphene
Spectroscopy
Spectrum analysis
single-layer graphene
electrode resistance
impedance spectroscopy
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Summary:In this work, we demonstrate the use of electrical impedance spectroscopy (EIS) for the disentanglement of several dielectric contributions in encapsulated single graphene layers. The dielectric data strongly vary qualitatively with the nominal graphene resistance. In the case of sufficiently low resistance of the graphene layers, the dielectric spectra are dominated by inductive contributions, which allow for disentanglement of the electrode/graphene interface resistance from the intrinsic graphene resistance by the application of an adequate equivalent circuit model. Higher resistance of the graphene layers leads to predominantly capacitive dielectric contributions, and the deconvolution is not feasible due to the experimental high frequency limit of the EIS technique.
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ISSN:2079-4991
2079-4991
DOI:10.3390/nano12050804