Self-pulsation dynamics in narrow stripe semiconductor lasers

• Published in: IEEE journal of quantum electronics Vol. 42; no. 3-4; pp. 381 - 388
• Main Authors: LANDAIS, Pascal, LYNCH, Stephen A, O'GORMAN, James, FISCHER, Ingo, ELSÄSSER, Wolfgang
• Format: Journal Article
• Language: English
• Published: New York, NY Institute of Electrical and Electronics Engineers 01.04.2006; The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
• Subjects: Beam trapping, self-focusing and defocusing; self-phase modulation; Cameras; Combustion; Dynamics; Evolution; Exact sciences and technology; Fundamental areas of phenomenology (including applications); Lasers; Nonlinear optics; Optics; Origins; Physics; Quantum electronics; Refractive index; Semiconductor lasers; Semiconductor lasers; laser diodes; Streak cameras; Self-pulsing; Optical self-focusing; Refractive index; self-pulsation (SP); Experimental study; Laser diodes; Time resolution; Self-focusing; Semiconductor lasers; spectral-hole burning; wave-guide; Hole burning; ps range
• ISSN: 0018-9197; 1558-1713
• DOI: 10.1109/JQE.2006.872309

In this paper, we address the physical origin of self-pulsation in narrow stripe edge emitting semiconductor lasers. We present both experimental time-averaged polarization-resolved near-field measurements performed with a charged-coupled device camera and picosecond time resolved near-field measurements performed with a streak camera. These results demonstrate dynamic spatial-hole burning during pulse formation and evolution. We conclude from these experimental results that the dominant process which drives the self-pulsation in this type of laser diode is carrier induced effective refractive index change induced by the spatial-hole burning.